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RGLL Thin Film Chip Resistor Slide 6

On this slide the chart exhibits the results of the 155°C high temperature exposure test for the RG series including the RGLL/RGVP. These resistors demonstrated almost no change over a period of 10000 hours. It is known that in general, reliability can be explained as the gradual oxidation of the resistive material. In the case of the RGLL/RGVP, trimming energy and annealing have already oxidized the thin film and inorganic passivation has locked out the oxygen to prevent further oxidation, making the RGLL/RGVP among the most stable resistors against heat.

PTM Published on: 2013-03-06